|
Volumn , Issue , 1996, Pages 689-692
|
Surface segregation as a means of gettering Cu in liquid-phase-epitaxy silicon thin layers grown from Al-Cu-Si solutions
a a a a a |
Author keywords
[No Author keywords available]
|
Indexed keywords
ALUMINUM;
COPPER;
LIQUID PHASE EPITAXY;
SECONDARY ION MASS SPECTROMETRY;
SUBSTRATES;
SURFACE PHENOMENA;
THIN FILMS;
X RAY PHOTOELECTRON SPECTROSCOPY;
GETTERING;
ION SCATTERING SPECTROSCOPY;
SURFACE SEGREGATION;
SILICON SOLAR CELLS;
|
EID: 0030415267
PISSN: 01608371
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/pvsc.1996.564223 Document Type: Conference Paper |
Times cited : (2)
|
References (4)
|