Characterization of diamond thin films by core-level photoabsorption and UV excitation Raman spectroscopy

Materials Research Society Symposium Proceedings

Volumn 437, Issue , 1996, Pages 211-218

  Zuiker, C D ^a   Krauss, A R ^a   Gruen, D M ^a   Carlisle, J A ^a   Terminello, L J ^a   Asher, S A ^a   Bormett, R W ^a  

^a ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; CHEMICAL VAPOR DEPOSITION; FILM GROWTH; FULLERENES; NANOSTRUCTURED MATERIALS; PHONONS; PLASMA APPLICATIONS; RAMAN SPECTROSCOPY; THIN FILMS;

CORE LEVEL PHOTOABSORPTION; ELECTRONIC BONDING; MICROWAVE PLASMA CHEMICAL VAPOR DEPOSITION; NEAR EDGE X RAY ABSORPTION FINE STRUCTURE (NEXAFS);

DIAMOND FILMS;

EID: 0030415214     PISSN: None     EISSN: None     Source Type: Journal    
DOI: 10.1557/proc-437-211     Document Type: Article

References (16)