Mesh refinement strategies for capacitance extraction based on residual errors

IEEE Topical Meeting on Electrical Performance of Electronic Packaging

Volumn , Issue , 1996, Pages 236-237

  Tausch, Johannes ^a   White, Jacob ^a  

^a MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ADAPTIVE ALGORITHMS; COMPUTER SIMULATION; ELECTRIC CONDUCTORS; ERROR ANALYSIS; ESTIMATION; MEASUREMENT ERRORS;

CAPACITANCE EXTRACTION; DISCRETIZATION; ERROR ESTIMATOR; MESH REFINEMENT; RESIDUAL ERRORS;

CAPACITANCE MEASUREMENT;

EID: 0030414865     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (3)