Controlled modification of conducting polymer surfaces by atomic force microscope

Journal of Materials Science Letters

Volumn 15, Issue 23, 1996, Pages 2080-2084

  Zhou, L ^a   Zhang, P C ^a   Ho, P K H ^a   Xu, G Q ^a   Li, S F Y ^a   Chan, L ^b  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

^b CHARTERED SEMICONDUCTOR MANUFACTURING LTD   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CONDUCTIVE PLASTICS; DOPING (ADDITIVES); ELECTRIC WIRE; EVAPORATION; MICROELECTRONICS; PLASTIC DEFORMATION; SILICON WAFERS; SOLVENTS; SUBSTRATES; SURFACE TREATMENT; THIN FILMS;

POLYANILINE; POLYOCTYLTHIOPHENE; POLYPYRROLE; POLYTHIOPHENE; SCANNING ELECTROCHEMICAL MICROSCOPE;

ORGANIC POLYMERS;

EID: 0030414479     PISSN: 02618028     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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