Depth profiling by ion beams analysis techniques for the characterization of interdiffusion in multilayered Au-Al systems

Surface and Interface Analysis

Volumn 24, Issue 13, 1996, Pages 868-874

  Markwitz, A ^a   Demortier, G ^a  

^a UNIVERSITY OF NAMUR   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM ALLOYS; BACKSCATTERING; DEPOSITION; EVAPORATION; INTERDIFFUSION (SOLIDS); INTERFACES (MATERIALS); INTERMETALLICS; ION BEAMS; MULTILAYERS; SPECTROSCOPY; SUBSTRATES; THIN FILMS;

HIGH ENERGY BACKSCATTERING SPECTROSCOPY; ION BEAM ANALYSIS;

METALLIC FILMS;

EID: 0030413262     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1096-9918(199612)24:13<868::AID-SIA199>3.0.CO;2-G     Document Type: Article

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