Total dose radiation hard 0.5 μm SOI CMOS transistors and 256K SRAMs

IEEE Radiation Effects Data Workshop

Volumn , Issue , 1996, Pages 62-66

  Liu, S T ^a   Jenkins, W C ^a  

^a HONEYWELL   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DOSIMETRY; ELECTRIC CURRENTS; RADIATION EFFECTS; SILICA; SILICON ON INSULATOR TECHNOLOGY; TRANSISTORS;

STATIC RANDOM ACCESS MEMORY (SRAM);

CMOS INTEGRATED CIRCUITS;

EID: 0030413225     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)