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Applied Physics Letters

Volumn 69, Issue 26, 1996, Pages 4081-4083

Evidence for internal electric fields in two variant ordered GaInP obtained by scanning capacitance microscopy

(4) Leong, J K a Williams, C C a Olson, J M b Froyen, S b

a UNIVERSITY OF UTAH (United States)

b NATIONAL RENEWABLE ENERGY LABORATORY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC FIELDS; ELECTRIC VARIABLES MEASUREMENT; ELECTRONIC PROPERTIES; METALLORGANIC VAPOR PHASE EPITAXY; MICROSCOPIC EXAMINATION; POLARIZATION; PYROELECTRICITY; SEMICONDUCTOR DOPING; SUBSTRATES; THERMAL EFFECTS;

DOPANT SEGREGATION; ELECTRICAL CHEMICAL CAPACITANCE VOLTAGE MEASUREMENT; EPILAYER; SCANNING CAPACITANCE MICROSCOPY;

SEMICONDUCTING GALLIUM COMPOUNDS;

EID: 0030412948 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.117825 Document Type: Article

Times cited : (16)

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