Selection of the optimal precision level and target value for a production process: The lower-specification-limit case

IIE Transactions (Institute of Industrial Engineers)

Volumn 28, Issue 12, 1996, Pages 979-985

  Chen, Shieh Liang ^a   Chung, Kun Jen ^b  

^a NATIONAL CHANGHUA UNIVERSITY OF EDUCATION   (Taiwan)

^b NATIONAL TAIWAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

INSPECTION; MATHEMATICAL MODELS; MEASUREMENT ERRORS; OPTIMAL CONTROL SYSTEMS; PROBLEM SOLVING; PROCESS CONTROL;

LOWER SPECIFICATION LIMIT; OPTIMAL MEASUREMENT PRECISION LEVEL; PROFITABLE TARGET VALUE;

QUALITY CONTROL;

EID: 0030412884     PISSN: 0740817X     EISSN: None     Source Type: Journal    
DOI: 10.1080/15458830.1996.11770752     Document Type: Article

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