Colossal magnetoresistance in Sm1-xSrxMnO3 films

Journal of Applied Physics

Volumn 80, Issue 12, 1996, Pages 6894-6897

  Kasai, Masahiro ^a   Kuwahara, Hideki ^a   Tomioka, Yasuhide ^a   Tokura, Yoshinori ^a,b  

^a JT RES CENTER FOR ATOM TECHNOLOGY   (Japan)

^b UNIVERSITY OF TOKYO   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

MAGNETIC FIELDS; MAGNETIC VARIABLES MEASUREMENT; MAGNETIZATION; MAGNETOMETERS; MAGNETORESISTANCE; MELTING; PULSED LASER APPLICATIONS; SEMICONDUCTING SAMARIUM COMPOUNDS; SINGLE CRYSTALS; THIN FILMS; TRANSPORT PROPERTIES; X RAY DIFFRACTION;

COLOSSAL MAGNETORESISTANCE; INSULATOR TO METAL TRANSITION; MAGNETOTRANSPORT PROPERTIES; MANGANITE; SUPERCONDUCTING QUANTUM INTERFERENCE DEVICE MAGNETOMETER; X RAY DIFFRACTION MEASUREMENT;

SEMICONDUCTING FILMS;

EID: 0030412826     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.363759     Document Type: Article

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