SCOPUS 정보 검색 플랫폼

Volumn 37, Issue 6, 1996, Pages 204-210

Characterisation of tin oxide films by complementary techniques

(20) Anderson, C f Arnold, G W f Bange, K f Baucke, F f Colombo, P d Della Mea, G f Dran, J C f Emiliani, G f Geotti Bianchini, F e Kawahara, H f Lehuede, P f Maddalena, A d Manocha, A S c Matzke, H J f Matzumoto, H b Mazzoldi, P f Noshiro, M f Polato, P f Principi, G d Rigato, V a

a LABORATORI NAZIONALI DI LEGNARO (Italy)

b ASAHI GLASS CO LTD (Japan)

c PPG INDUSTRIES (United States)

d Dipartimento di Ingegneria Meccanica (Italy)

e STAZIONE SPERIMENTALE DEL VETRO (Italy)

f NONE

Author keywords

[No Author keywords available]

Indexed keywords

GLASS; INTERDIFFUSION (SOLIDS); MICROSTRUCTURE; MORPHOLOGY; MOSSBAUER SPECTROSCOPY; OPTICAL PROPERTIES; SPECTROPHOTOMETRY; SPUTTER DEPOSITION; STOICHIOMETRY; TIN COMPOUNDS;

SODA LIME GLASS; TIN DIOXIDE;

INORGANIC COATINGS;

EID: 0030412736 PISSN: 00171050 EISSN: None Source Type: Journal
DOI: None Document Type: Article

Times cited : (1)

References (11)

1
- 0024112954
- Anderson, C., Della Mea, G., Emiliani, G., Kawahara, H., Mazzoldi, P., Noshiro, M., Polato, P. & Wuest, I. Glastech. Ber., 1988, 61, 326.
- (1988) Glastech. Ber. , vol.61 , pp. 326
- Anderson, C.¹ Della Mea, G.² Emiliani, G.³ Kawahara, H.⁴ Mazzoldi, P.⁵ Noshiro, M.⁶ Polato, P.⁷ Wuest, I.⁸

2
- 0042299776
- Arnold, G. W., Della Mea, G., Dran, J. C., Kawahara, H., Lehuede, P., Matzke, H. J., Mazzoldi, P., Noshiro, M. & Pantano, C. Glass Technol., 1990, 31, (2), 58-63.
- (1990) Glass Technol. , vol.31 , Issue.2 , pp. 58-63
- Arnold, G.W.¹ Della Mea, G.² Dran, J.C.³ Kawahara, H.⁴ Lehuede, P.⁵ Matzke, H.J.⁶ Mazzoldi, P.⁷ Noshiro, M.⁸ Pantano, C.⁹

3
- 0002723940
- Montecchi, M., Masetti, E. & Emiliani, G. Pure Appl. Opt., 1995, 4, 15.
- (1995) Pure Appl. Opt. , vol.4 , pp. 15
- Montecchi, M.¹ Masetti, E.² Emiliani, G.³

4
- 0004198677
- Academic Press, New York
- Chu, W. K., Mayer, J. W. & Nicolet, M. Backscattering spectrometry. 1978. Academic Press, New York.
- (1978) Backscattering Spectrometry
- Chu, W.K.¹ Mayer, J.W.² Nicolet, M.³

5
- 84955841751
- Enzo, S., Polizzi, S. & Benedetti, A. Z. Kristallographie, 1985, 170, 275.
- (1985) Z. Kristallographie , vol.170 , pp. 275
- Enzo, S.¹ Polizzi, S.² Benedetti, A.³

6
- 34249918342
- Principi, G., Maddalena, A., Gupta, A., Dal Maschio, R., Dirè, S. Hyp. Inter., 1991, 69, 619.
- (1991) Hyp. Inter. , vol.69 , pp. 619
- Principi, G.¹ Maddalena, A.² Gupta, A.³ Dal Maschio, R.⁴ Dirè, S.⁵

7
- 0040978238
- Collins, G. S., Kachnowski, T. & Boenczer-Koller, N. Phys. Rev. B, 1979, 19,1369.
- (1979) Phys. Rev. B , vol.19 , pp. 1369
- Collins, G.S.¹ Kachnowski, T.² Boenczer-Koller, N.³

8
- 0016630688
- Budd, S. M. J. Non-Cryst. Solids, 1975, 19, 55.
- (1975) J. Non-Cryst. Solids , vol.19 , pp. 55
- Budd, S.M.¹

9
- 0024622501
- Stedile, F. C., De Barros, A. S., Leite, C. V., Freire, F. L., Jnr, Baumvol, I. J. R. & Schreiner, W. H. Thin Solid Films, 1989, 170, 285.
- (1989) Thin Solid Films , vol.170 , pp. 285
- Stedile, F.C.¹ De Barros, A.S.² Leite, C.V.³ Freire Jr., F.L.⁴ Baumvol, I.J.R.⁵ Schreiner, W.H.⁶

10
- 3743130565
- Varnek, V. A. & Chernyshev, A. P. Inorg. Mater., 1982, 18, 700.
- (1982) Inorg. Mater. , vol.18 , pp. 700
- Varnek, V.A.¹ Chernyshev, A.P.²

11
- 0018470155
- Leja, E., Korecki, J., Krop, K. & Toll, K. Thin Solid Films, 1979, 59, 147.
- (1979) Thin Solid Films , vol.59 , pp. 147
- Leja, E.¹ Korecki, J.² Krop, K.³ Toll, K.⁴

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.