In situ measurement of electrical conductivity of alumina under electron irradiation in a high voltage electron microscope

Journal of Nuclear Materials

Volumn 239, Issue 1-3, 1996, Pages 245-252

  Howlader, M M R ^a   Kinoshita, C ^a   Izu, T ^a   Shiiyama, K ^a   Kutsuwada, M ^a  

^a KYUSHU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CERAMIC MATERIALS; DOSIMETRY; ELECTRIC CONDUCTIVITY MEASUREMENT; ELECTRIC EXCITATION; ELECTRIC FIELD EFFECTS; ELECTRON MICROSCOPY; FUSION REACTORS; IRRADIATION; RADIATION DAMAGE; THERMAL CONDUCTIVITY OF SOLIDS; THERMAL EFFECTS; THERMAL INSULATING MATERIALS;

ELECTRON IRRADIATION; HIGH VOLTAGE ELECTRON MICROSCOPY (HVEM); RADIATION INDUCED CONDUCTIVITY (RIC); RADIATION INDUCED ELECTRICAL DEGRADATION (RIED); THERMALLY STIMULATED CONDUCTIVITY (TSC);

ALUMINA;

EID: 0030412356     PISSN: 00223115     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-3115(96)00426-6     Document Type: Article

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