Current single event effect test results for candidate spacecraft electronics

IEEE Radiation Effects Data Workshop

Volumn , Issue , 1996, Pages 19-27

  LaBel, Kenneth A ^a   Moran, Amy K ^a   Hawkins, Donald K ^a   Sanders, Anthony B ^a   Seidleck, Christina M ^a   Kim, Hak S ^a   Forney, James E ^a   Stassinopoulos, E G ^a   Marshall, Paul ^a   Dale, Cheryl ^a   Kinnison, James ^a   Carkhuff, Bliss ^a  

^a NASA GODDARD SPACE FLIGHT CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC EQUIPMENT; ENERGY TRANSFER; POWER CONVERTERS; RANDOM ACCESS STORAGE; ROM;

DYNAMIC RANDOM ACCESS MEMORY (DRAM); LINEAR ENERGY TRANSFER (LET); SINGLE EVENT EFFECT (SEE); SPACECRAFT ELECTRONICS;

SPACECRAFT EQUIPMENT;

EID: 0030412270     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)