Effects of KCN etching on Cu-rich epitaxial CuInSe2 thin films

Materials Research Society Symposium - Proceedings

Volumn 426, Issue , 1996, Pages 213-218

  Fons, P ^a   Niki, S ^a   Yamada, A ^a   Nishitani, M ^a   Wada, T ^a   Kurafuji, T ^a  

^a ELECTROTECHNICAL LABORATORY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPOSITION EFFECTS; COPPER COMPOUNDS; DIFFRACTOMETERS; ETCHING; FILM GROWTH; MOLECULAR BEAM EPITAXY; SEMICONDUCTING GALLIUM ARSENIDE; THIN FILMS;

CHALCOPYRITES; COPPER INDIUM DISELENIDE; COPPER ROTATING ANODE X RAY SOURCE; ELECTRON PROBE MICROANALYSIS (EPMA);

SEMICONDUCTING FILMS;

EID: 0030411759     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-426-213     Document Type: Conference Paper

References (9)