Determination of surface atomic layer of RBa2Cu3Oy thin films and SrTiO3 (001) single crystal by glancing-incidence-exit x-ray diffuse scattering

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2696, Issue 2/-, 1996, Pages 627-635

  Liu, Ziyuan ^a   Ogota, Seiya ^a   Morishita, Tadataka ^a  

^a SUPERCONDUCTIVITY RESEARCH LABORATORY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

RUBIDIUM BARIUM COPPER OXIDES; SURFACE ATOMIC LAYERS; X RAY DIFFUSE SCATTERING;

ATOMS; LASER APPLICATIONS; NEODYMIUM COMPOUNDS; OXIDE SUPERCONDUCTORS; RUBIDIUM COMPOUNDS; SINGLE CRYSTALS; STRONTIUM COMPOUNDS; THIN FILMS; X RAY ANALYSIS;

HIGH TEMPERATURE SUPERCONDUCTORS;

EID: 0030411709     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (20)