Optical and calorimetric evaluation of Z-93-P and other thermal control coatings

Thin Solid Films

Volumn 290-291, Issue , 1996, Pages 278-282

  Jaworske, Donald A ^a  

^a NASA GLENN RESEARCH CENTER   (United States)

Author keywords

Absorptivity; Emissivity; Thermal control coatings

Indexed keywords

ALUMINUM; CALORIMETRY; LIGHT ABSORPTION; LIGHT EMISSION; REFLECTOMETERS; THERMAL EFFECTS;

THERMAL CONTROL COATINGS;

REFLECTIVE COATINGS;

EID: 0030410494     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(96)08969-9     Document Type: Article

References (6)

1. J.T. Neu, M.T. Beecroft andSchramm, Extended performance infrared directional reflectometer for the measurement of total, diffuse and specular reflectance, in Proc. of the Society of Photo-Optical Instrumentation Engineers, Vol. 2260, Stray Radiation in Optical Systems III, San Diego, CA, 1994.
2. R. Siegel and J.R. Howell, Thermal Radiation Heat Transfer, 3rd ed., Hemisphere Publishing Company, Washington, DC, 1992.
3. D.A. Jaworske, Thermal modeling of a calorimetric technique for measuring the emittance of surfaces and coatings, Thin Solid Films, 236 (1993) 146-152.
4. Y.S. Touloukian and E.H. Buvco, Thermophysical Properties of Matter, Volume 4, IFI/Plenum, New York, 1970.
5. Y.S. Touloukian and E.H. Buvco, Thermophysical Properties of Matter, Volume 5, IFI/Plenum, New York, 1970.
6. H. Babel, personal communication, 1995.