Adhesion mechanisms of silica layers on plasma-treated polymers. part i. polycarbonate

Journal of Adhesion Science and Technology

Volumn 10, Issue 12, 1996, Pages 1287-1311

  Vallon, S ^a   Hofrichter, A ^a   Guyot, L ^a   Drevillon B ^a   Klemberg Sapieha, J E ^b   Martinu, L ^b   Poncin Epaillard, F ^c  

^a LABORATOIRE DE PHYSIQUE DES INTERFACES ET DES COUCHES MINCES   (France)

^b ÉCOLE POLYTECHNIQUE DE MONTRÉAL   (Canada)

^c UNIVERSITÉ DU MAINE   (France)

Author keywords

Adhesion; Ellipsometry; Plasma treatment; Polycarbonate; Silica

Indexed keywords

ACID BASE INTERACTION; ACIDIC SITES; ADHESION ENHANCEMENT; ADHESION MECHANISMS; AR PLASMA TREATMENT; COVALENT BONDING; DONOR GROUPS; ELECTRON-ACCEPTOR; IN-SITU; IN-SITU IR; MICRO-SCRATCH TEST; OXYGEN ATOM; PHENOLIC GROUPS; PLASMA TREATMENT; POLYMER SURFACES; SILICA LAYERS; UV PHOTONS; UV-VISIBLE;

CONTACT ANGLE; CROSSLINKING; ELLIPSOMETRY; GRAFTING (CHEMICAL); NITROGEN; PHENOLS; PLASMA APPLICATIONS; PLASMA THEORY; POLYCARBONATES; POLYMERS; SILICA; X RAY PHOTOELECTRON SPECTROSCOPY; CHEMICAL BONDS; COMPOSITION EFFECTS; PH EFFECTS; SURFACE TREATMENT;

ADHESION;

ACID BASE INTERACTIONS; CONTACT ANGLE MEASUREMENTS; INFRARED ELLIPSOMETRY; MICROSCRATCH TESTS; PLASMA TREATMENT;

EID: 0030410322     PISSN: 01694243     EISSN: 15685616     Source Type: Journal    
DOI: 10.1163/156856196X00256     Document Type: Article

References (32)

1. D. W. Fox, in: Kirk-Othmer Encyclopedia of Chemical Technology, M. Grayson (Ed.), 3rd edn, Vol. 18, pp. 479-494. Wiley-Interscience, New York (1982).
2. J. C. Rostaing, F. Coeuret, B. Drévillon, R. Etemadi, C. Godet, J. Hue, J. Y. Parey and V. A. Yakovlev, Thin Soliti Films 236, 58-63 (1993).
3. E. M. Liston, L. Martinu and M. R. Wertheimer, J. Adhesion Sci. Technol. 7, 1091-1127 (1993).
4. M. Hudis, in: Techniques and Applications of Plasma Chemistry, J. R. Hollahan and A. T. Bell (Eds), pp. 113-147. Wiley-lnterscience, New York (1974).
5. S. Vallon, B. Drévillon, F. Poncin-Epaillard and J. C. Rostaing, Mater. Res. Soc. Symp. Proc. 385, 27-32 (1995).
6. S. Vallon, B. Drévillon, F. Poncin-Epaillard, J. E. Klemberg-Sapieha and L. Martinu, J. Vac. Sci. Technol. A (in press).
7. A. Rivaton, D. Sallet and J. Lemaire, Polym. Photochem. 3, 463-481 (1983).
8. R. Etemadi, C. Godct, M. Kildemo, J. E. Bourée, R. Brenot and B. Drévillon, J. Non-Cryst. Solids 187, 70-74 (1995).
9. L. Martinu, J. E. Klemberg-Sapieha and M. R. Wertheimer, Appi. Phys. Lett. 54, 2645-2647 (1989).
10. L. Martinu, O. M. Kuttel, A. Raveh, J. E. Klemberg-Sapieha and M. R. Wertheimer, J. Vac. Sci. Technol. A 12, 1360-1364 (1994).
11. B. Drévillon, Prog. Cryst. Growth Charact. Mater. 27, 1-87 (1993).
12. A. Canillas, E. Pascual and B. Drévillon, Rev. Sci. Instrum. 64, 2153-2159 (1993).
13. R. J. Good, J. Adhesion Sci. Technol. 6, 1269-1302 (1992).
14. J. Behnisch, A. Hollander and H. Zimmcrmann, J. Appi Polym. Sci. 49, 117-124 (1993).
15. R. M. A. Azzam and N. M. Bashara, Ellipsometry and Polarized Light. Elsevier, Amsterdam (1987).
16. N. Blayo and B. Drévillon, Appi. Phys. Lett. 59, 950-952 (1991); J. Non-Cryst. Solids 137-138, 771-774 (1991).
17. S. Vallon, E. Compain and B. Drévillon, Rev. Sci. Instrum. 66. 3269-3272 (1995).
18. D. Lin-Vien, N. B. Colthup, W. G. Fateley and J. G. Grasselli, The Handbook of Infrared and Raman Characteristic Frequencies of Organic Molecules. Academic Press, Boston (1991).
19. G. Beamson and D. Briggs, High Resolution XPS of Organic Polymers. John Wiley, New York (1992).
20. C. Jama, O. Dessaux, P. Goudmand, L. Gengembre and J. Grimblot, Surface Interface Anal. 18, 751-756 (1992).
21. D. T. Clark and A. Harrison, J. Polym. Sci., Polym. Chem. Ed. 19, 1945-1955 (1981).
22. L. J. Gerenser, J. Adhesion Sci. Technol. 1, 303-318 (1987).
23. J. E. Klemberg-Sapieha, O. M. Kiittel, L. Martinu and M. R. Wertheimer, J. Vac. Sci. Technol. A 9, 2975-2981 (1991).
24. S. Pankasem, J. Kuczynski and J. K. Thomas, Macromolecules 27, 3773-3781 (1994).
25. D. E. Aspnes, Thin Solid Films 89, 249-262 (1982).
26. D. W. van Krevelen, Properties of Polymers, their Estimation and Correlation with Chemical Structure, p. 216. Elsevier, Amsterdam (1976).
27. V. Yakovlev, B. Drevillon, N. Layadi and P. Roca i Cabarrocas, J. Appl. Phys. 74, 2535-2542 (1993).
28. P. J. Burnett and D. S. Rickerby, Thin Solid Films 157, 233-254 (1988).
29. K. L. Mittal, in: Adhesion Measurement of Films and Coatings, K. L. Mittal (Ed.), pp. 1-13. VSP, Zeist (1995).
30. S. J. Bull and D. S. Rickerby, Surface Coat. Technol. 42, 149-161 (1990).
31. M. K. Shi, A. Selmani, L. Martinu, E. Sacher, M. R. Wertheimer and A. Yelon, J. Adhesion Sci. Technol. 8, 1129-1141 (1994).
32. C. J. Pouchert, The Aldrich Library of Infrared Spectra, 2nd edn, pp. 1313-1316. Aldrich Chemical Company, Milwaukee (1975).