Residual stress of monoclinic zircon obtained by X-ray diffraction in ZY4 oxidized cladding tubes

Materials Science Forum

Volumn 228-231, Issue PART 2, 1996, Pages 845-850

  Jacquot, Th ^a,b   Guillen, R ^a   Francois M ^a   Bourniquel, B ^a   Senevat, J ^b  

^a UNIVERSITÉ DE NANTES   (France)

^b Usine de Paimboeuf   (France)

Author keywords

Residual Stress; Texture; Tube; X Ray Diffraction; Zircaloy 4; Zircon

Indexed keywords

CALCULATIONS; CHARACTERIZATION; CORROSION; CRYSTAL STRUCTURE; CRYSTALLOGRAPHY; NONDESTRUCTIVE EXAMINATION; RADIATION; REACTION KINETICS; RESIDUAL STRESSES; TEXTURES; X RAY DIFFRACTION; ZIRCONIUM ALLOYS;

CLASSIC GONIOMETRIC CONFIGURATION; KINETIC TRANSITION; MONOCLINIC ZIRCON; OXIDIZED CLADDING TUBE; STRESS MEASUREMENT;

ZIRCON;

EID: 0030410221     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.228-231.845     Document Type: Article

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