ESD protection circuit for TFSOI technology

IEEE International SOI Conference

Volumn , Issue , 1996, Pages 170-171

  Smith, Jeremy C ^a   Lien, Mitch ^a   Veeraraghavan, Surya ^a  

^a MOTOROLA INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC BREAKDOWN; ELECTRIC DISCHARGES; ELECTRIC NETWORK ANALYSIS; ELECTROSTATICS; GATES (TRANSISTOR); INTEGRATED CIRCUIT LAYOUT; LEAKAGE CURRENTS;

ELECTROSTATIC DISCHARGE (ESD);

SILICON ON INSULATOR TECHNOLOGY;

EID: 0030410190     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)