Virtual test of noise and jitter parameters

IEEE International Test Conference (TC)

Volumn , Issue , 1996, Pages 461-470

  Helmreich, K ^a   Reinwardt, G ^a  

^a Advantest Europe   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRIC NETWORK PARAMETERS; PROGRAM DEBUGGING; SPURIOUS SIGNAL NOISE;

JITTER PARAMETERS; VIRTUAL NOISE TEST;

INTEGRATED CIRCUIT TESTING;

EID: 0030409509     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)