Synthesis of self-testing finite state machines from high-level specification

IEEE International Test Conference (TC)

Volumn , Issue , 1996, Pages 757-766

  Agrawal, Vishwani D ^a   Blanton, R D ^a   Damiani, Maurizio ^a  

^a LUCENT TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER HARDWARE DESCRIPTION LANGUAGES; COMPUTER SIMULATION; DATA COMPRESSION; ELECTRIC FAULT CURRENTS; FINITE AUTOMATA; FLIP FLOP CIRCUITS; GRAPH THEORY; LOGIC CIRCUITS; OPTIMIZATION;

FINITE STATE MACHINES; HIGH LEVEL SPECIFICATION;

INTEGRATED CIRCUIT TESTING;

EID: 0030409506     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (18)