Automatic inspection of solder joints using layered illumination

IEEE International Conference on Image Processing

Volumn 2, Issue , 1996, Pages 645-648

  Kim, Tae Hyeon ^a   Cho, Tai Hoon ^a   Moon, Young Shik ^a   Park, Sung Han ^a  

^a Hanyang University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

FEATURE EXTRACTION; IMAGE SEGMENTATION; LIGHT EMITTING DIODES; SOLDERED JOINTS; SURFACE MOUNT TECHNOLOGY;

ILLUMINATION ANGLES; TILT ANGLES;

IMAGING TECHNIQUES;

EID: 0030408765     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)