Fine structure of scanning field emission microscope (SFEM) image

Vacuum

Volumn 47, Issue 12, 1996, Pages 1479-1482

  Barwinski, B ^a   Sendecki, S ^a  

^a UNIVERSITY OF WROC AW   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

FIELD EMISSION MICROSCOPES; IMAGING TECHNIQUES; OPTICAL RESOLVING POWER; SURFACE STRUCTURE;

ATOMIC RESOLUTION; SCANNING FIELD EMISSION MICROSCOPE (SFEM) IMAGES; SURFACE ATOMIC STRUCTURES;

TUNGSTEN;

EID: 0030408725     PISSN: 0042207X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0042-207X(96)00222-9     Document Type: Article

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