Experience with silicon detectors at the DELPHI experiment, LEP

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 383, Issue 1, 1996, Pages 1-6

  Collins, P ^a  

^a CERN   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC DISCHARGES; PARTICLE BEAM TRACKING; SEMICONDUCTING SILICON; SILICON SENSORS; SPURIOUS SIGNAL NOISE;

MICRODISCHARGE PHENOMENA; SILICON DETECTORS;

PARTICLE DETECTORS;

EID: 0030408708     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(96)00623-7     Document Type: Article

References (6)

1. V. Chabaud et al., The DELPHI silicon strip microvertex detector with double sided readout, CERN-PPE/95-86, 14 June 1995.
2. T. Ohsugi et al., Nucl. Instr. and Meth. A 342 (1994) 22.
3. A. Andreazza et al., Proc. 7th Wire Chamber Conf., Vienna, 13-17 February 1995, Nucl. Instr. and Meth. A 367 (1995) 198. DELPHI Collaboration, Proposal for the DELPHI very forward tracker, CERN/LEPC/93-6 92-142.
4. A. Andreazza et al., Proc. 7th Wire Chamber Conf., Vienna, 13-17 February 1995, Nucl. Instr. and Meth. A 367 (1995) 198. DELPHI Collaboration, Proposal for the DELPHI very forward tracker, CERN/LEPC/93-6 92-142.
5. Ardelean et al., Proc. Nuclear Science Symp., October 30-November 1994, Norfolk, Virginia, USA, p. 27.
6. R. Brenner and C. Eklund, First testbench measurements of the DELPHI vertex detector Outer layer modules for the 1996 upgrade, HU-SEFT RD 1995-04.