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Volumn 31, Issue 24, 1996, Pages 6403-6407

Interface characterization of a β-SiC whisker-Al composite

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM ALLOYS; CRYSTAL LATTICES; CRYSTAL ORIENTATION; CRYSTAL WHISKERS; CRYSTALLOGRAPHY; DISLOCATIONS (CRYSTALS); INTERFACES (MATERIALS); SILICON CARBIDE; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0030408480     PISSN: 00222461     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF00356242     Document Type: Article
Times cited : (9)

References (34)
  • 30
    • 25444520855 scopus 로고
    • Shanghai Science and Technology Publishing House, Shanghai, China
    • N. B. MIN, "Physical basics of the growth of crystals" (Shanghai Science and Technology Publishing House, Shanghai, China, 1982) p. 283.
    • (1982) Physical Basics of the Growth of Crystals , pp. 283
    • Min, N.B.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.