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Volumn 44, Issue 4, 1996, Pages 357-366
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Investigation of the chalcogen interdiffusion in CuIn(TeSe)2 thin films
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Author keywords
CuInSe2; CuInTe2; Depth profile; Graded bandgap; Grazing incidence; Solar cell; Thin film; XRD
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Indexed keywords
ANNEALING;
CRYSTAL STRUCTURE;
EPITAXIAL GROWTH;
FILM GROWTH;
INTERDIFFUSION (SOLIDS);
PHASE INTERFACES;
SEMICONDUCTING SELENIUM COMPOUNDS;
SEMICONDUCTING TELLURIUM COMPOUNDS;
SOLAR CELLS;
THERMAL EFFECTS;
X RAY DIFFRACTION ANALYSIS;
COPPER INDIUM SELENIDES;
COPPER INDIUM TELLURIDES;
MOLYBDENUM BACK ELECTRODE;
PHASE DEPTH PROFILE;
THIN FILMS;
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EID: 0030408385
PISSN: 09270248
EISSN: None
Source Type: Journal
DOI: 10.1016/S0927-0248(95)00158-1 Document Type: Article |
Times cited : (13)
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References (16)
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