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Volumn 44, Issue 4, 1996, Pages 357-366

Investigation of the chalcogen interdiffusion in CuIn(TeSe)2 thin films

Author keywords

CuInSe2; CuInTe2; Depth profile; Graded bandgap; Grazing incidence; Solar cell; Thin film; XRD

Indexed keywords

ANNEALING; CRYSTAL STRUCTURE; EPITAXIAL GROWTH; FILM GROWTH; INTERDIFFUSION (SOLIDS); PHASE INTERFACES; SEMICONDUCTING SELENIUM COMPOUNDS; SEMICONDUCTING TELLURIUM COMPOUNDS; SOLAR CELLS; THERMAL EFFECTS; X RAY DIFFRACTION ANALYSIS;

EID: 0030408385     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0927-0248(95)00158-1     Document Type: Article
Times cited : (13)

References (16)
  • 10
    • 85029973948 scopus 로고    scopus 로고
    • Landolt Boernstein III/6, 932
    • Landolt Boernstein III/6, 932.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.