Automatic test-generation for predicates

IEEE Transactions on Reliability

Volumn 45, Issue 4, 1996, Pages 515-530

  Paradkar, Amit ^a   Watson, Ibm T J ^a   Tai, Hawthorne K C ^a   Vouk, Raleigh M A ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

Automatic test generation; Cause effect graph; Predicate; Specification based testing

Indexed keywords

BOOLEAN FUNCTIONS; CONSTRAINT THEORY; ERROR DETECTION; FAILURE ANALYSIS; GRAPH THEORY; LOGIC PROGRAMMING; MATHEMATICAL OPERATORS;

AUTOMATIC TEST GENERATION; CAUSE EFFECT GRAPH;

SOFTWARE ENGINEERING;

EID: 0030408225     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/24.556575     Document Type: Article

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