Design of the UltraSPARC-I microprocessor for manufacturing performance

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2874, Issue , 1996, Pages 179-186

  Youngs, Lynn ^a   Billus, Greg ^a   Jones, Anjali ^a   Paramanandam, Siva ^a  

^a TEXAS INSTRUMENTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EPIC3 CMOS QLM PROCESS; ULTRASPARC-I MICROPROCESSOR;

AUTOMATION; CMOS INTEGRATED CIRCUITS; DESIGN; FAILURE ANALYSIS; MANUFACTURE; MICROELECTRONICS; MONITORING; PERFORMANCE; TESTING;

MICROPROCESSORS;

EID: 0030407822     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (13)