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Volumn 429, Issue , 1996, Pages 343-347
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Sub-half micron elevated source/drain NMOSFETs by low temperature selective epitaxial deposition
a a a a a a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
ANNEALING;
CHEMICAL VAPOR DEPOSITION;
EPITAXIAL GROWTH;
ETCHING;
ION IMPLANTATION;
LEAKAGE CURRENTS;
SEMICONDUCTOR DEVICE MANUFACTURE;
SILANES;
THERMAL CYCLING;
LOW TEMPERATURE SELECTIVE DEPOSITION;
SELECTIVE EPITAXIAL GROWTH;
THERMAL BUDGET;
UHV RAPID THERMAL CHEMICAL VAPOR DEPOSITION;
MOSFET DEVICES;
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EID: 0030407495
PISSN: 02729172
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1557/proc-429-343 Document Type: Conference Paper |
Times cited : (2)
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References (11)
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