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Volumn 429, Issue , 1996, Pages 343-347

Sub-half micron elevated source/drain NMOSFETs by low temperature selective epitaxial deposition

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CHEMICAL VAPOR DEPOSITION; EPITAXIAL GROWTH; ETCHING; ION IMPLANTATION; LEAKAGE CURRENTS; SEMICONDUCTOR DEVICE MANUFACTURE; SILANES; THERMAL CYCLING;

EID: 0030407495     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-429-343     Document Type: Conference Paper
Times cited : (2)

References (11)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.