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Volumn 422, Issue , 1996, Pages 155-160
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EXAFS and X-ray CTR scattering characterization of Er doped in InP by OMVPE
a a a a a a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
CRYSTAL MICROSTRUCTURE;
ENERGY ABSORPTION;
INDIUM COMPOUNDS;
LUMINESCENCE OF INORGANIC SOLIDS;
MONOLAYERS;
OPTICAL COMMUNICATION EQUIPMENT;
PHOSPHORUS COMPOUNDS;
SEMICONDUCTING INDIUM PHOSPHIDE;
SEMICONDUCTOR DOPING;
X RAY CRYSTALLOGRAPHY;
ABSORPTION REGION;
INDIUM PHOSPHIDE;
LUMINESCENCE EFFICIENCY;
SODIUM CHLORIDE STRUCTURE;
X RAY SCATTERING;
ERBIUM;
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EID: 0030407134
PISSN: 02729172
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1557/proc-422-155 Document Type: Conference Paper |
Times cited : (9)
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References (8)
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