Scaling issues and Ge profile optimization in advanced UHV/CVD SiGe HBTs

Proceedings of the IEEE Bipolar/BiCMOS Circuits and Technology Meeting

Volumn , Issue , 1996, Pages 19-22

  Richey, David M ^a   Cressler, John D ^a  

^a AUBURN UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL VAPOR DEPOSITION; CIRCUIT OSCILLATIONS; COMPUTER SIMULATION; ELECTRIC CURRENT MEASUREMENT; OPTIMIZATION; SEMICONDUCTING GERMANIUM COMPOUNDS; SEMICONDUCTING SILICON COMPOUNDS; SEMICONDUCTOR DEVICE MODELS; SEMICONDUCTOR DOPING; THERMAL EFFECTS;

ANALOG INTEGRATED CIRCUITS; CUTOFF FREQUENCY; SOFTWARE PACKAGE SCORPIO;

HETEROJUNCTION BIPOLAR TRANSISTORS;

EID: 0030407036     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)