Application of a survey sampling critical area computation tool in a manufacturing environment

IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems

Volumn , Issue , 1996, Pages 48-52

  Duvivier, Frederic ^a   Allan, Gerard A ^a  

^a STMICROELECTRONICS   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUIT MANUFACTURE; PARAMETER ESTIMATION; SEMICONDUCTOR DEVICE MODELS; TRANSISTORS;

CRITICAL AREAS; SOFTWARE PACKAGE EDINBURGH YIELD ESTIMATOR SAMPLING (EYES);

ULSI CIRCUITS;

EID: 0030406806     PISSN: 10636722     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (17)