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Volumn 43, Issue 12, 1996, Pages 2109-2112

A switching device based on a-Si:H n-i-δp-i-n stacked structure: modeling and characterization

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SILICON; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CURRENTS; ELECTRON EMISSION; ELECTRONS; MATHEMATICAL MODELS; SEMICONDUCTOR DEVICE STRUCTURES; SEMICONDUCTOR JUNCTIONS; SWITCHING FUNCTIONS;

EID: 0030406225     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.544381     Document Type: Article
Times cited : (8)

References (10)
  • 2
    • 0028751581 scopus 로고    scopus 로고
    • "a-Si TFT technologies for AM-LCDS,"
    • vol. 336, p. 749, 1994.
    • N. Ibaraki, "a-Si TFT technologies for AM-LCDS," Mat. Res. Symp. Proc., vol. 336, p. 749, 1994.
    • Mat. Res. Symp. Proc.
    • Ibaraki, N.1
  • 3
    • 0028419965 scopus 로고    scopus 로고
    • "Metal/insulator/metal type structures based on amorphous carbon-silicon alloys: Electronic properties in dark conditions and under illumination,"
    • vol. 3, p. 874, 1994.
    • R. Vincenzoni, G. Leo, and F. Galluzzi, "Metal/insulator/metal type structures based on amorphous carbon-silicon alloys: Electronic properties in dark conditions and under illumination," Diamond Rel. Mater., vol. 3, p. 874, 1994.
    • Diamond Rel. Mater.
    • Vincenzoni, R.1    Leo, G.2    Galluzzi, F.3
  • 5
    • 0343543016 scopus 로고    scopus 로고
    • "Amorphous silicon p-i-n-i-p and n-i-p-i-n diodes,"
    • vol. 48, p. 1006, 1986.
    • J. Dresner, "Amorphous silicon p-i-n-i-p and n-i-p-i-n diodes," Appl. Phys. Lett., vol. 48, p. 1006, 1986.
    • Appl. Phys. Lett.
    • Dresner, J.1
  • 7
    • 0001438128 scopus 로고    scopus 로고
    • "Current induced degradation in boron-doped hydrogenated amorphous silicon: A novel investigation technique,"
    • vol. 77, p. 1133, 1995.
    • G. Masini, G. de Cesare, and F. Palma, "Current induced degradation in boron-doped hydrogenated amorphous silicon: A novel investigation technique," J. Appl. Phys., vol. 77, p. 1133, 1995.
    • J. Appl. Phys.
    • Masini, G.1    De Cesare, G.2    Palma, F.3
  • 10
    • 84897584017 scopus 로고    scopus 로고
    • "On modeling trivalent dangling bonds with bivalent levels,"
    • 1994, vol. 336, p. 153.
    • V. Suntharalingam and H. M. Branz, "On modeling trivalent dangling bonds with bivalent levels," Mat. Res. Symp. Proc., 1994, vol. 336, p. 153.
    • Mat. Res. Symp. Proc.
    • Suntharalingam, V.1    Branz, H.M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.