Growth analysis of cadmium sulfide thin films by atomic force microscopy

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 1996, Pages 945-948

  Moutinho, H R ^a   Dhere, R G ^a   Ramanathan, K ^a   Sheldon, P ^a   Kazmerski, L L ^a  

^a NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; DEPOSITION; ENERGY GAP; FILM GROWTH; GRAIN SIZE AND SHAPE; NUCLEATION; SEMICONDUCTING CADMIUM COMPOUNDS; SEMICONDUCTING GLASS; SEMICONDUCTING TIN COMPOUNDS; SPECTROSCOPY;

CADMIUM SULFIDE THIN FILMS; GROWTH ANALYSIS; TIN DIOXIDE;

THIN FILMS;

EID: 0030406097     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/pvsc.1996.564285     Document Type: Conference Paper

References (9)