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Volumn 383, Issue 1, 1996, Pages 137-143
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Study of spatial resolution and efficiency of silicon strip detectors with charge division readout
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Author keywords
[No Author keywords available]
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Indexed keywords
CAPACITANCE;
CROSSTALK;
ELECTRIC CHARGE;
MAGNETIC FIELD EFFECTS;
MICROSTRIP DEVICES;
PARTICLE BEAM TRACKING;
READOUT SYSTEMS;
SEMICONDUCTOR DEVICE STRUCTURES;
SILICON SENSORS;
SPURIOUS SIGNAL NOISE;
CHARGE DIVISION READOUT;
MICROSTRIP SILICON DETECTORS;
PARTICLE DETECTORS;
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EID: 0030406079
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-9002(96)00666-3 Document Type: Article |
Times cited : (8)
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References (11)
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