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Volumn 86-87, Issue PART 1, 1996, Pages 33-40
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On the possibility of tailoring a compositional gradient in thin films sputtered from a MoSi2 + XSiC composite target
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Author keywords
Bias deposition; Composite film; Molybdenum disilicide; R.f. Magnetron sputtering
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Indexed keywords
AUGER ELECTRON SPECTROSCOPY;
CHEMICAL MODIFICATION;
COMPOSITE MATERIALS;
MAGNETRON SPUTTERING;
MOLYBDENUM COMPOUNDS;
OXIDATION;
SCANNING ELECTRON MICROSCOPY;
SILICON CARBIDE;
X RAY DIFFRACTION ANALYSIS;
BIAS DEPOSITION;
COMPOSITIONAL GRADIENT;
MOLYBDENUM DISILICIDE;
TAILORING;
THIN FILMS;
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EID: 0030405562
PISSN: 02578972
EISSN: None
Source Type: Journal
DOI: 10.1016/S0257-8972(96)03031-9 Document Type: Article |
Times cited : (9)
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References (6)
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