Piezoelectric characterization of bulk and thin film ferroelectric materials using fiber optics

Materials Research Society Symposium - Proceedings

Volumn 433, Issue , 1996, Pages 317-323

  Dawley, J T ^a   Teowee, G ^a   Zelinski, B J J ^a   Uhlmann, D R ^a  

^a UNIVERSITY OF ARIZONA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FIBER OPTICS; OPTICAL VARIABLES MEASUREMENT; PIEZOELECTRICITY; THIN FILMS;

MTI 2000 FOTONIC SENSOR;

FERROELECTRIC MATERIALS;

EID: 0030402827     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-433-317     Document Type: Conference Paper

References (20)