Self-similar texture characterization using Wigner-Ville distribution

IEEE International Conference on Image Processing

Volumn 3, Issue , 1996, Pages 141-144

  Wen, C Y ^a   Acharya, R ^a  

^a UNIVERSITY AT BUFFALO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FRACTALS; MAGNETIC RESONANCE IMAGING; MATHEMATICAL MODELS; PARAMETER ESTIMATION; PERFORMANCE; SPECTRUM ANALYSIS;

SELF SIMILAR TEXTURE CHARACTERIZATION; WIGNER-VILLE DISTRIBUTION;

IMAGE ANALYSIS;

EID: 0030402761     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)