Identification and test generation for primitive faults

IEEE International Test Conference (TC)

Volumn , Issue , 1996, Pages 423-432

  Krstic, Angela ^a   Cheng, Kwang Ting ^a   Chakradhar, Srimat T ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMBINATORIAL CIRCUITS; ELECTRIC FAULT CURRENTS; ELECTRIC NETWORK ANALYSIS;

BENCHMARK CIRCUITS; MULTIPLE PATH DELAY FAULTS; PRIMITIVE FAULTS;

INTEGRATED CIRCUIT TESTING;

EID: 0030402726     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (15)