Microscopic driving forces for electromigration

Materials Research Society Symposium - Proceedings

Volumn 427, Issue , 1996, Pages 73-81

  Sorbello, Richard S ^a  

^a UNIVERSITY OF WISCONSIN MILWAUKEE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DEFECTS; CRYSTAL IMPURITIES; DIFFUSION IN SOLIDS; ELECTRON TRANSPORT PROPERTIES; GRAIN BOUNDARIES; HEATING; METALLOGRAPHIC MICROSTRUCTURE;

ATOMIC CURRENTS; ATOMIC DEFECTS;

ELECTROMIGRATION;

EID: 0030401883     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-427-73     Document Type: Conference Paper

References (25)