Application of MXCD to magnetic thin-film sensors

Materials Research Society Symposium Proceedings

Volumn 437, Issue , 1996, Pages 79-84

  Bedrossian, P J ^a   Tobin, J G ^a   Jankowski, A F ^a   Waddill, G D ^a   Anthony, T C ^a   Brug, J A ^a  

^a LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ERROR ANALYSIS; MAGNETIC MOMENTS; MAGNETIC VARIABLES MEASUREMENT; MAGNETORESISTANCE; SENSORS;

MAGNETIC X RAY CIRCULAR DICHROISM (MXCD);

MAGNETIC THIN FILM DEVICES;

EID: 0030401646     PISSN: None     EISSN: None     Source Type: Journal    
DOI: 10.1557/proc-437-79     Document Type: Article

References (14)