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Volumn 4, Issue 6, 1996, Pages 1263-1277

Study of fullerenes, nanotubes and nanowires by transmission electron microscopy

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DEFECTS; CRYSTAL LATTICES; CRYSTAL ORIENTATION; CRYSTALLINE MATERIALS; ELASTICITY; ELECTRON DIFFRACTION; GRAPHITE; INTERFACES (MATERIALS); NANOSTRUCTURED MATERIALS; POWDERS; STRAIN; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0030401411     PISSN: 1064122X     EISSN: None     Source Type: Journal    
DOI: 10.1080/10641229608001178     Document Type: Article
Times cited : (23)

References (46)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.