1/f noise in CMOS transistors for analog applications

Proceedings - IEEE Convention of Electrical & Electronics Engineers in Israel

Volumn , Issue , 1996, Pages 557-560

  Jakobson, C G ^a   Bloom, I ^a   Nemirovsky, Y ^a  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; ELECTRIC VARIABLES MEASUREMENT; FABRICATION; LINEAR INTEGRATED CIRCUITS; MATHEMATICAL MODELS; OPTIMIZATION; SPURIOUS SIGNAL NOISE; TRANSCONDUCTANCE;

DRAIN BIAS VOLTAGES; GATE VOLTAGES; THRESHOLD VOLTAGE;

MOSFET DEVICES;

EID: 0030401011     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)