Statistical sampling and regression analysis for RT-level power evaluation

IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers

Volumn , Issue , 1996, Pages 583-588

  Hsieh, Cheng Ta ^a   Wu, Qing ^a   Ding, Chih Shun ^a   Pedram, Massoud ^a  

^a UNIVERSITY OF SOUTHERN CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; MICROPROCESSOR CHIPS; PARAMETER ESTIMATION; RANDOM PROCESSES; REGRESSION ANALYSIS; SEMICONDUCTOR DEVICE MODELS;

POWER MACROMODELING FORMULATION; REGISTER TRANSFER LEVEL POWER EVALUATION; SIMPLE RANDOM SAMPLING;

INTEGRATED CIRCUIT LAYOUT;

EID: 0030400091     PISSN: 10923152     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)