Fast marching the global minimum of active contours

IEEE International Conference on Image Processing

Volumn 1, Issue , 1996, Pages 473-476

  Cohen, Laurent D ^a   Kimmel, Ron ^a  

^a UNIVERSITÉ PARIS DESCARTES   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EDGE DETECTION; INTEGRAL EQUATIONS; MATHEMATICAL MODELS; MEDICAL IMAGING; NUMERICAL METHODS;

ACTIVE CONTOUR MODEL; EDGE INTEGRATION; MINIMAL ACTION PATHS;

FEATURE EXTRACTION;

EID: 0030399997     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (18)