|
Volumn 383, Issue 1, 1996, Pages 155-158
|
Radiation damage experience at CDF with SVX′
a b a c d e e,f e g c d d d |
Author keywords
[No Author keywords available]
|
Indexed keywords
COLLIDING BEAM ACCELERATORS;
DOSIMETRY;
FIELD EFFECT TRANSISTORS;
MICROSTRIP DEVICES;
RADIATION DAMAGE;
RADIATION HARDENING;
READOUT SYSTEMS;
SILICON SENSORS;
SPURIOUS SIGNAL NOISE;
RADIATION HARD READOUT CHIPS;
SILICON MICROSTRIP DETECTORS;
PARTICLE DETECTORS;
|
EID: 0030399913
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-9002(96)00621-3 Document Type: Article |
Times cited : (24)
|
References (12)
|