Arithmetic pattern generators for built-in self-test

Proceedings - IEEE International Conference on Computer Design: VLSI in Computers and Processors

Volumn , Issue , 1996, Pages 131-134

  Stroele, Albrecht P ^a  

^a UNIVERSITY OF KARLSRUHE   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ADDERS; BINARY SEQUENCES; ELECTRIC FAULT CURRENTS; MULTIPLYING CIRCUITS; SHIFT REGISTERS;

ARITHMETIC LOGIC UNITS (ALU); BUILT IN SELF TEST (BIST); PATTERN GENERATORS;

INTEGRATED CIRCUIT TESTING;

EID: 0030399718     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)