Industrial implementation of diffractive optical elements for nondestructive testing

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2868, Issue , 1996, Pages 216-224

  Hanson, Steen G ^a   Lindvold, Lars R ^a   Hansen, Bengt H ^a  

^a Riso Natl Lab   (France)

Author keywords

[No Author keywords available]

Indexed keywords

COMMON-PATH INTERFEROMETERS; ELECTRONIC SPECKLE PATTERNS;

FABRICATION; HOLOGRAPHY; NONDESTRUCTIVE EXAMINATION; OPTICAL SYSTEMS; SEMICONDUCTOR LASERS; SPECKLE;

VIBRATION MEASUREMENT;

EID: 0030399489     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)