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Volumn , Issue , 1996, Pages 27-30
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Improved reliability self-aligned C/X-band monolithic power HBT amplifiers fabricated with a low-stress process
a
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Author keywords
[No Author keywords available]
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Indexed keywords
DIELECTRIC MATERIALS;
ELECTRIC CURRENTS;
FAILURE ANALYSIS;
HIGH TEMPERATURE TESTING;
INTEGRATED CIRCUIT TESTING;
POWER AMPLIFIERS;
RELIABILITY;
STRESS ANALYSIS;
TEMPERATURE;
BIAS STRESS TESTING;
LOW STRESS PROCESS;
MONOLITHIC AMPLIFIERS;
HETEROJUNCTION BIPOLAR TRANSISTORS;
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EID: 0030399279
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
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Times cited : (16)
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References (10)
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