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Volumn 35, Issue 36, 1996, Pages 7061-7065

Laser-induced damage studies in silicon and silicon-based photodetectors

Author keywords

[No Author keywords available]

Indexed keywords

AVALANCHE DIODES; CARRIER CONCENTRATION; FREQUENCIES; LASER BEAM EFFECTS; LEAKAGE CURRENTS; PHOTODIODES; SEMICONDUCTING SILICON; SINGLE CRYSTALS; THERMAL STRESS;

EID: 0030399150     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.35.007061     Document Type: Article
Times cited : (43)

References (29)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.