Asynchronous scan path concept for micropipelines using the bundled data convention

IEEE International Test Conference (TC)

Volumn , Issue , 1996, Pages 225-231

  Schoeber, Volker ^a   Kiel, Thomas ^a  

^a LEIBNIZ UNIVERSITY HANNOVER   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ASYNCHRONOUS SEQUENTIAL LOGIC; CRITICAL PATH ANALYSIS; OBSERVABILITY; PIPELINE PROCESSING SYSTEMS; SHIFT REGISTERS;

BUNDLED DATA CONVENTION; SCAN PATH REGISTER;

INTEGRATED CIRCUIT TESTING;

EID: 0030398942     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (22)